Introduction to Scanning
Probe Microscopy
The
family of microscopes known as scanning probe microscopes (SPMs), most notably
the atomic force microscope (AFM), were introduced at the end of the twentieth
century. They immediately gained broad popularity among academic and industrial
laboratories due to the instruments’ versatility for non-destructive,
real-time imaging of surfaces (both hard and soft materials including biological
specimens and liquids) at micro-scale down to atomic resolution, along with the
ability to characterize mechanical, adhesive, electrical, magnetic, and other
properties. In this graduate course, students will learn basics of design and
fundamental physics behind the SPM technique. The lectures will also discuss
analysis of the solid surfaces regarding roughness, topography, heterogeneity,
and adhesion properties. Additionally, artifacts associated with inappropriate
conditions in AFM imaging will be discussed as well. A training in the operation
of the AFM instrument and exploration of its capability during the laboratory
sessions will complement the lectures.
Offered
first half of Fall semester.
Instructor:
Jarek Drelich (M&M 506)
Office
Hours: Mondays 2-5 pm (subject to change)
Fall 2007:
Lectures on WF 12:05-12:55 pm (M&M 610)
Laboratories:
1) W 9:05-11:55am or W 2:05-4:55 pm or F 9:05-11:55 am (M&M 616)
Textbook: There is no textbook available to this
course. The instructor will distribute a number of handouts.
Goal of the Course: Introduction to analysis of
solid surfaces with practical training of operation of the Dimension 3000 atomic
force microscope.
Lectures
- Introduction to scanning probe microscopy (SPM); SPM versus scanning
electron microscopy and optical microscopy
- Basic components and principles of operation of the SPM instrumentation;
AFM modes
- Surface topographic imaging; artifacts and noise
- Surface topography presentation and analysis; roughness
parameters
- Compositional mapping of heterogeneous solid surfaces: phase imaging and
lateral force microscopy
- Surface force measurements with SPM; spring constant of cantilever
- Adhesion mapping and adhesion force measurements; introduction to adhesion
science
- Colloidal probe technique and measurements of colloidal forces
Labs (subject to modification)
Week 1: Basic training with the AFM Dimension 3000 (instruction)Week 2: AFM imaging and analysis of
structured substrates
(instruction)
Week 3: Mapping of solid surface composition/heterogeneity (instruction)
Week 4: AFM pull-off force measurements (instruction)
Week 5: Measurements of colloidal forces with Nanoscope II
(instruction)
Week 6: Practical exam (instruction)
Week 7: Special project prepared by students
General Instruction: Guidelines for operation of the AFM Dimension 3000
Grading: 35% Lab reports,
20% Homework, 15% Practical exam, and 30%
Special group project (report and laboratory tests)
