Research
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Materials Characterization Facilities
Facilities
Materials Characterization & Fabrication Facilities (MCFF)
A number of these instruments were included in the Applied Chemical & Morphological Analysis Laboratory (ACMAL), formed in the summer of 2003, to serve the University Campus at large.
- Metallography, optical microscopy, and quantitative image analysis;
- 2 scanning electron microscopes;
- 2 Transmission electron microscopes, including an atomic resolution JEOL4000FX with a point to point resolution of 2.0 Angstroms;
- 2 Atomic Force Microscopes (AFM);
- A JEOL scanning electron microprobe;
- A Physical Electronics Scanning Auger Microscope;
- Complete powder characterization instrumentation, including a sedigraph, pycnometer, and high resolution density determination instruments;
- X-Ray diffraction facilities, including computerized powder diffractometers with accessories for texture determination and residual stress analysis;
- X-Ray spectrometer for determining bulk chemical composition, as well as instruments for determining carbon and sulfur levels;
- Differential scanning calorimeters and thermal analyzers.
- A full line of instruments for characterizing minerals, including microscopy, wet chemical analysis, atomic absorption, thermal analysis, size analysis, assaying, and density/size determination;
Institute of Materials Processing
Image Analysis
The MSE Department uses the PAX-it Image Analysis Software and the PAXcam Digital Microscope Camera.
Contact
Electron optics: Owen Mills
X-Ray diffraction: Ed Laitila
Metallography: Ruth Kramer
AFM: Jarek Drelich
DSC: Doug Swenson
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