MY 3200 Materials Characterization I
Topics to be covered.
- Optical Metallography & Quantitative
Image Analysis
- Mechanical testing
- Crystal Geometry
- Review of crystal systems,
- lattice vectors,
- lattice points,
- planes and directions - Miller Indices,
- Hexagonal Miller-Bravais Indices {hkil} and conversion
to/from Miller Indices {hkl}.
- Stereographic Projections
- Scanning Electron Microscopy
- Secondary electron imaging - topography
- Backscattered electron imaging - composition
- X-Ray
Diffraction/Electron Diffraction
- Spectroscopy
- Band gap of a semiconductor
- Tensile Testing Experiment
- Hardness Experiment
- Particle Size Distribution Experiment
- Measurement of Grain Size Experiment
- Metallography of Steel
- Oxidation Experiment
- TTT diagrams
- Viscosity Experiment
- Fracture Experiment
Students must be familiar with using EXCEL and MATHCAD. Attendance in
class is not mandatory but there are numerous problem solving sessions
in class.
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